by Advanconn

The Innovative Portable Ultrasonic Testing Device
Unleash Real-time and Flexible AI Defect Recognition Analysis Anywhere, Anytime

Non-destructive Evaluation (NDE) is commonly adopted to examine the condition of structural components, finding damage or cracks before they become problematic. A collaborative breakthrough by TrueFlaw & Aetina has made it possible to facilitate cutting-edge AI solutions for the non-destructive testing industry, such as steel structure building, bridges, tracks, pressure vessels, petrochemical pipelines, and equipment.

The innovative portable ultrasonic testing device achieves seamless data streaming, automatic defect recognition and real-time AI analysis, revolutionizing on-the-go defect inspection. Users can simply move a probe to gather data from a test object and instant recognition results are delivered to a web-based application for quick access and informed decision-making. The abundant AI performance offered by Aetina’s embedded Edge AI developer kit prompted TrueFlaw to continually choose the next-generation successor, NVIDIA Jetson AGX Orin. Consequently, Aetina’s AIB-MX13/23 developer kit was further enhanced for tailored customization to provide insights into new objectives while reducing data analysis time.

Featured Results from Collaboration

  • Unlock visual recognition capabilities with the Jetson-powered AI solution
  • Propel efficient throughputs with high precision, reducing manual intervention
  • Effortlessly automated measurement for lumber stacks and bulk material

Compliant Products

NVIDIA Jetson AGX Orin – AIB-MX13/23
Supports NVIDIA Jetson AGX Orin™ 32GB/64GB Module Up to 275 TOPS of AI Performance Wide Input Voltage Range From 9 to 36VDC 1 x M.2 B-Key/1 x E-Key/1 x M-Key Slot 1 x GbE/1 x 10GbE LAN Port Operating Temperature: -25°C ~ +80°C

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